The Micred Powertester enables integrated thermal and power analysis of power semiconductors under real operating conditions. By combining power cycling tests with transient thermal characterization, the device provides valuable insights into the thermal behavior and lifetime prediction (reliability and longevity) of semiconductor components.
Power cycle tests with transient thermal characterization
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Detailed performance analysis
Understand the exact performance behavior of your components under simulated operating loads and identify specific weak points.
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Real-time diagnostics
React immediately to performance deviations during the test run thanks to real-time monitoring.
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Flexible test configurations
Adapt the test environment to the specific requirements of your products, such as current levels and thermal conditions.
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Parallel testing of several components
Test and analyze up to 16 semiconductor components and accelerate the development of entire product series.
Your service provider and sales partner for metering systems
We are your contact for the purchase of Siemens Simcenter Micred products such as the Powertester. As an experienced service provider, we can advise you on
Your service provider and sales partner for metering systems
We are your contact for the purchase of Siemens Simcenter Micred products such as the power tester. As an experienced service provider, we also provide you with impartial advice.
Consulting for the right solution for your testing needs
Contact for measurement of power electronics and other solutions from the Simcenter portfolio
Implementation, integration and maintenance
Technical support and assistance for users
Handling of methodological questions and partners for outsourced development tasks in the semiconductor context
Your configuration, your personal ROI
I would be happy to advise you on the optimum product configuration and support you in determining the return on investment (ROI) in your application.
Dr.-Ing. Ömer Yildiz
Whitepaper
Thermal characterization of complex electronics
Learning to understand structural functions
Use thermal characterization to reduce the risk of thermal failure and avoid recalls. Learn how to use thermal transient measurement for semiconductor component development in this white paper.
Download Whitepaper